Advanced Processing and Characterization Technologies

Advanced Processing and Characterization Technologies

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Effect of Window Diffusion Stripe Structure on Reduction of Temperature Rise at Laser Facet Aklhlro Shlma, Yoshihiro Kokubo and Masao Alga Optoelectronic aamp; Microwave Devices Raamp;D Laboratory Mitsubishi Electric Corporation 4-1, Mizuhara, Itami Hyogo, 664 Japan 1. Introduction Recently ... Figure 1 shows a schematic diagram of the system for the measurement of the temperature at the laser mirror.


Title:Advanced Processing and Characterization Technologies
Author: Paul H. Holloway
Publisher:Amer Inst of Physics - 1991
ISBN-13:

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